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1999

[MANC-99] G. Mancina, R. Prost, G. Prudon, B. Gautier, and J. C. Dupuy, "Deconvolution SIMS depth profiles: toward the limits of the resolution by self-deconvolution test", Proceeding SIMS XII, Brussels, Belgium, pp. 497–500, 1999.

1997

[GAUT-97] B. Gautier, J. C. Dupuy, R. Prost, and G. Prudon, "Effectiveness and Limits of the Deconvolution of SIMS Depth Profiles of Boron in Silicon", Surf Interface Anal, vol. 25, pp. 464-477, 1997.

1996

[GAUT-96] B. Gautier, R. Prost, G. Prudon, and J. C. Dupuy, "Deconvolution of SIMS depth profiles of boron in silicon", Surf Interface Anal, vol. 24, pp. 733-745, 1996.