| Titre | What do micro-CT examinations reveal at various resolutions : a study of the same trabecular samples at the 14, 7 and 2 micron level |
| Publication Type | Invited Conference |
| Authors | Peyrin, F, Salome-Pateyron, M, Cloetens, P, Ludwig, W, Ritman, E, Ruegsegger, P, Laval-Jeantet, AM, Baruchel, J |
| Full Text |
What do micro-CT examinations reveal at various resolutions : a study of the same trabecular samples at the 14, 7 and 2 micron level