Jump to navigation

Home
  • Rss feed
  • Authentication
  • Webmail
  • Intranet
  • Français
  • News
  • Seminars
  • Organization
    • Direction
    • Organization chart
    • People directory
    • Industry partnerships
    • Access-contact
  • Research
    • Research teams
    • Transversal Projects
    • Imaging platform
    • Software
    • Publications
    • Patents / Start-ups
  • Job opportunities
    • Permanent positions
    • Thesis, Post-Doctoral
    • Masters, Internship
    • Other positions
  • Studies & Training
    • Doctoral studies
    • Master studies
    • Online training

You are here

  1. Home ›
  2. Investigation of artefact sources in synchrotron microtomography via virtual X-ray imaging
TitleInvestigation of artefact sources in synchrotron microtomography via virtual X-ray imaging
Publication TypeJournal Article
AuthorsVidal, FP, Létang, JM, Peix, G, Cloetens, P
Full Text
Investigation of artefact sources in synchrotron microtomography via virtual X-ray imaging
  • Google Scholar
  • BibTex
  • RTF
  • Tagged
  • MARC
  • XML
  • RIS
  • Contact
  • Map
  • Legal Notices
  • Site map